Statistics Research Reports from AT&T Laboratories

[1988] [1992] [1993] [1994] [1995] [1996]

1988

[88.1] A New Algorithm for Matched Case Control Studies with Applications to Additive Models.

Trevor Hastie and Daryl Pregibon

[88.2] Writing a Graphics Device Function for S.

Richard A. Becker

1992

[92.1] A Discussion of "All or None" Inspection Policies

Scott Vander Wiel, Stephen Vardeman

1993

[93.1] Images in S

John M. Chambers, Neil Crellin

[93.2] Maps in S

Richard A. Becker, Allan R. Wilks

[93.3] Optimal Discrete Adjustments for Short Production Runs

Scott Vander Wiel

[93.4] A Model for Studying Display Methods of Statistical Graphics

William S. Cleveland

[93.5] An Interface From S to Mathematica

Javier F. Cabrera, Allan R. Wilks

[93.6] Identifying Word Correspondances in Parallel Text

William A. Gale, Kenneth W. Church

[93.7] A Program for Aligning Sentences in Bilingual Corpora

William A. Gale, Kenneth W. Church

[93.8] Chronological Objects in S

David A. James, Daryl Pregibon

[93.9] Local Regression: Automatic Kernel Carpentry

Trevor Hastie, Clive Loader

[93.10] Change Point Estimation Using Nonparametric Regression

Clive Loader

[93.11] Varying-coefficient models

Trevor Hastie and Robert Tibshirani

[93.12] Penalized Discriminant Analysis

Trevor Hastie, Andreas Buja and Robert Tibshirani

[93.13] Flexible Discriminant Analysis by Optimal Scoring

Trevor Hastie, Robert Tibshirani and Andreas Buja

[93.14] Testing Software for (and with) Data Analysis

John Chambers

[93.15] Data Management in S (Dec. 23, 1991)

John Chambers

[93.16] Robust Parameter Design with Uncontrolled Noise Variables

Anne E. Freeny and Vijayan N. Nair

[93.17] Measures of Disclosure Risk and Harm

Diane Lambert

[93.18] Snapshot:A Plot Showing Progress Through a Device Development Laboratory

Diane Lambert, James M. Landwehr and Ming-Jen Shyu

[93.19] Coplots, Nonparametric Regression, and Conditionally Parametric Fits

William S. Cleveland

[93.20] Simultaneous Confidence Bands in Linear Regression and Smoothing

Jiayang Sun, Clive Loader

[93.21] Greater or Lesser Statistics: A Choice for Future Research.

John M. Chambers

[93.22] Handwritten Digit Recognition via Deformable Prototypes.

Trevor Hastie and Robert Tibshirani

[93.23] Assessing Software Designs using Capture-Recapture Methods.

Scott Vander Wiel and Lawrence Votta

[93.24] Overdispersion Diagnostics for Generalized Linear Models.

Diane Lambert and Kathryn Roeder

[93.25] Images in S (compact version of 93-1, without images).

John M. Chambers, Neil Crellin

[93.26] Classes and Methods in S. I: Recent Developments.

John M. Chambers

[93.27] Classes and Methods in S. II: Future Directions.

John M. Chambers

[93.28] Methods for Assessing Distributional Assumptions in One and Two Sample Problems.

Vijayan N. Nair and Anne E. Freeny

[93.29] Graphical Analysis for a Large Designed Experiment.

Anne E. Freeny and James M. Landwehr

[93.30] Planarization by Chemical-Mechanical Polishing: A Rate and Uniformity Study.

Anne E. Freeny and Warren Y.-C. Lai

[93.31] Local Likelihood Density Estimation

Clive Loader

1994

[94.1] Monitoring Processes that Wander Using Integrated Moving Average Models

Scott Vander Wiel

[94.2] Variables in Data Frames

John M. Chambers

[94.3] Comments on Fast Implementations of Nonparametric Curve Estimators by Jianqing Fan and James S. Marron

William S. Cleveland and Clive Loader

[94.4] Learning Prototype Models for Tangent Distance

Trevor Hastie, Patrice Simard and Eduard Sackinger

[94.5] Good-Turing Smoothing Without Tears

William A. Gale

[94.6] Discriminant Analysis by Gaussian Mixtures

Trevor Hastie and Robert Tibshirani

[94.7] Computing Nonparametric Function Estimates

Clive Loader

[94.8] Local Fitting for Semiparametric (Nonparametric) Regression: Comments on a Paper of Fan and Marron

William S. Cleveland and Clive Loader

[94.9] Trellis Display: Questions and Answers

Richard A. Becker, William S. Cleveland, and Ming-Jen Shyu

[94.10] Trellis Displays: User's Guide (S-PLUS Trellis 1.0 only)

Richard A. Becker, William S. Cleveland, Ming-Jen Shyu and Stephen P. Kaluzny

[94.11] A Brief History of S

Richard A. Becker

1995

[95.1] Overview of Version 4 of S

John M. Chambers

[95.2] Constructing a Geographical Database

Richard A. Becker and Allan R. Wilks

[95.3] Smoothing by Local Regression: Principles and Methods

William S. Cleveland and Clive Loader

[95.4] LOCFIT: A program for local fitting

Clive Loader

[95.5] Controlling Graphics Devices for Statistical Graphics

Allan R. Wilks

[95.6] Constraint-Based Representations of Statistical Graphs

Allan R. Wilks

[95.7] Pictor Reference Manual

Allan R. Wilks

[95.8] [color] [black+white] The Visual Design and Control of Trellis Display.

Richard A. Becker, William S. Cleveland, Ming-Jen Shyu

[95.9] Old Faithful Erupts: Bandwidth Selection Reviewed

Clive Loader

[95.10] Model-free estimation of some yield metrics in integrated circuit fabrication.

D. Friedman, M. Hansen, V. Nair and D. James

[95.11] Polynomial splines and their tensor products in extended linear modeling

C. Stone, M. Hansen, C. Koopergerg and Y. Truong

[95.12] [color] [black+white] A Tour of Trellis Graphics.

Richard A. Becker, William S. Cleveland, Ming-Jen Shyu and Stephen P. Kaluzny

[95.13] [color] [black+white] Trellis Graphics User's Manual.

Richard A. Becker, William S. Cleveland, Ming-Jen Shyu and Stephen P. Kaluzny

[95.14] Optimal Blocking Schemes for Fractional Factorial Designs

Don X. Sun, C.F.J. Wu and Y.Y. Chen

[95.15] A statistical approach to automatic speech recognition using the atomic speech units constructed from overlapping articulatory features

Li Deng and Don X. Sun

[95.16] Hidden Markov models with Non-stationary states for speech recognition

Don X. Sun and Li Deng

[95.17] Robust estimation of spectral center-of-gravity trajectories using mixture spline models

Don X. Sun

[95.18] Analysis of Acoustic-Phonetic Variations in Fluent Speech Using TIMIT

Don X. Sun and Li Deng

[95.19] Process and Productivity Improvement in Semiconductor Manufacturing

Mark Hansen and Vijayan Nair

1996

[96.1] [color] [black+white] Multipanel Conditioning: Modeling Data from Designed Experiments.

William S. Cleveland and Montserrat Fuentes

[96.2] Monitoring wafer map data from integrated circuit fabrication processes for spatially clustered defects.

M. Hansen, D. Friedman and V. Nair

[96.3] Estimating the Rate of Extreme Events: Beyond the Threshold

R. Becker, L. Clark and D. Lambert

[96.4] Triogram Models

M. Hansen, C. Kooperberg and S. Sardy
[HTML/Java version]

[96.5] Nonparametric Maximum Likelihood Estimation From Samples with Irrelevant Data and Verification Bias.

Diane Lambert and Luke Tierney

[96.6] Model-Free Estimation of Defect Clustering in Integrated Circuit Fabrication (Revision of 95.10.ps)

David Friedman, M. Hansen, Vijay Nair and David James

[96.7] Manual Controls For High-Dimensional Data Projections

Dianne Cook, Andreas Buja

[96.8] Theory and Computational Methods for Dynamic Projections in High-Dimensional Data Visualization

Andreas Buja, Dianne Cook, Daniel Asimov, Catherine Hurley

[96.9] Missing Data in Interactive High-Dimensional Data Visualization

Deborah Swayne, Andreas Buja

[96.10] XGobi: Interactive Dynamic Data Visualization in the X Window System

Deborah Swayne, Dianne Cook, Andreas Buja