@techreport{TD-7QVJGD,
	att_abstract={},
	att_authors={jy1348},
	att_categories={ },
	att_copyright={},
	att_copyright_notice={},
	att_private={false},
	att_projects={ },
	att_techdoc={true},
	att_techdoc_key={TD-7QVJGD},
	att_url={http://web1.research.att.com:81/tdfiles/TD-7QVJGD.pdf},
	author={Jennifer Yates and Ramana Kompella and Albert Greenberg and Alex Snoeren},
	month={April},
	title={{Fault Localization via Risk Modeling}},
	year=2009,
}